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20–30 MHz: ±0
Signal Generation for Storage Device Testing
2mVpp–10Vpp (open-circuit) ≤20 MHz: 1mVpp–10Vpp (into 50Ω)
Specification Value DC Outputs Number of Outputs 1 Voltage/Current 8 V/8 A or 20 V/4 A Power (max) 80 W Load and Line Regulation Voltage <0
5609-20-J Fluke Test Lead New Act Prob 20–30 MHz: ±0Features: 328 to 1,238F ( 200 to 670C) (3. 94in (100mm) minimum immersion) 0. 01 short term stability Calibration not included, NVLAP accredited calibration optional, lab code 200348 0 Specifications: Temperature Range 328 to 1,238F ( 200 to 670C) Nominal Resistance at 0. 01C 100 0. 5 Temperature Coefficient 0. 0039250 C Short Term Repeatability 0. 01 at 0. 010C; 0. 02C at max temp Drift 0. 01 at 0. 010C; 0. 02C at max temp Hysteresis 0. 01C maximum
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